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MCU development and application of t

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KRJ-5600 - type microcontroller technology development and application of integrated experimental device
Devices from control panels, composed experimental tables, through the completion of this test-bed microcontroller interface can be expanded, data acquisition, data showed, keyboard control, timers, printer interface, and other experiments, equipped with simulators. Current-leakage protection with a device control screen if leakage phenomenon, leakage current over a certain value, that is, to cut off power to play a physical security protection.
Experimental Experimental Module includes Taiwan
The experimental setup is pulse, level, the level that drive, conversion, keyboard, LED display, interface, AD and DA conversion, memory, sensors and other conventional experimental circuit, it increased the watchdog, logic T, frequency terms IC card reader, clock / calendar, voice recorders, RS232 to 485, USB, CPLD, and other special experimental module.
The main technical parameters
1, input supply: AC220V ± 5% 50HZ;
2, the current: ≤ 2 A
3, ambient temperature: -5 ° C -40 ° C
4, appearance size: 1600 X700X1300 (mm)
Pilot project
1, reset the memory block
2, the binary code conversion BCD
3, binary ASCII conversion
4, procedures Jump Table
5, the memory block mobile
6, data sorting
7, P1 mouth input and output experiment
8, Relay Control Experiment
9, with 74 LS245 Reading into the experimental data
10, with 74 LS273 output data experiment
11, serial data conversion parallel experimental data
12, parallel data transfer serial data test
13, PWM converter voltage experiment
14, Audio Control Experiment
15,8255 input and output experiment
16,8155 input and output experiment
17,5 LED display static Serial Experiment
18,6 LED display dynamic scanning experiment
19, inquiries keypads experiment
20, the experimental array keypads
21, counter experiment
22, timer experiment
23,8253 timer experiment
24, the external interrupt experiment
25, serial port communication experiments
26, ADC0809 modulus conversion experiments
27, DAC0832 digital-to-analog conversion experiments
28, MC14433 modulus conversion experiments
29, external data EEPROM memory experimental procedure
30, SRAM external data memory expansion experiment
31,93 C46 serial EEPROM data read and write
32, e-clock experiments
33, the flower simulation experiments
34, Micro Printer Control Experiment
35, automobile turn signal simulation
36, the temperature sensor temperature control experiment
37, the temperature process control experiment
38, the five-phase stepper motor experiment
39, calculator experiment
40, the digital frequency meter experiment
41, V / F conversion experiments
42, F / V conversion experiments
43, LED dot matrix display experiment
44, for character LCD experiment
45,8279 keyboard display experiment
46, watchdog experiment
47,8251 serial port expansion communication experiment
48, I 2C bus experiment
49,232 to 485 Experiment
50, USB interface experiment
51, the experimental traffic lights at a crossroads
52, the five functional logic T Experiment
53, the DC motor-driven Speed Experiment (in kind)
54, stepper motor drive (in kind)
55, IC card reader experiment
56, the real-time clock / calendar Control Experiment
57, voice chip Control Experiment
58, LIN bus interface for multi-machine communication experiments
59, Ethernet Control Experiment
60, the CAN bus interface experimental multi-machine communication
61, MCU and CPLD experiment

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SHANGHAI KERONG TEACHING APPARATUS CO.,LTD
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